Assessing the quality of scanning probe microscope designs
نویسندگان
چکیده
منابع مشابه
Assessing the quality of scanning probe microscope designs
We present a method for assessing an atomic force microscope’s (AFM’s) ability to reject externally applied vibrations. This method is demonstrated on one commercial and two prototype AFMs. For optimally functioning AFMs, we find that the response to externally applied vibrations obeys a 1/ω2 frequency dependence. This 1/ω2 frequency dependence can be understood by modelling the mechanical syst...
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متن کاملstudying of various nanolithography methods by using scanning probe microscope
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ژورنال
عنوان ژورنال: Nanotechnology
سال: 2001
ISSN: 0957-4484,1361-6528
DOI: 10.1088/0957-4484/12/3/331